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dc.contributor.author
Ciappa, M.
dc.contributor.author
Malberti, P.
dc.contributor.author
Fichtner, W.
dc.contributor.author
Cova, P.
dc.contributor.author
Cattani, L.
dc.contributor.author
Fantini, F.
dc.date.accessioned
2017-06-12T19:23:55Z
dc.date.available
2017-06-12T19:23:55Z
dc.date.issued
1999-06
dc.identifier.issn
0026-2714
dc.identifier.issn
1872-941X
dc.identifier.other
10.1016/S0026-2714(99)00160-2
dc.identifier.uri
http://hdl.handle.net/20.500.11850/127701
dc.language.iso
en
dc.publisher
Elsevier
dc.title
Lifetime extrapolation for IGBT modules under realistic operation conditions
dc.type
Journal Article
ethz.journal.title
Microelectronics Reliability
ethz.journal.volume
39
ethz.journal.issue
6-7
ethz.journal.abbreviated
Microelectron. reliab.
ethz.pages.start
1131
ethz.pages.end
1136
ethz.notes
.
ethz.identifier.nebis
001933457
ethz.publication.place
Kidlington
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03380 - Huang, Qiuting / Huang, Qiuting
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03380 - Huang, Qiuting / Huang, Qiuting
ethz.date.deposited
2017-06-12T19:24:36Z
ethz.source
ECIT
ethz.identifier.importid
imp59365533d213d84739
ethz.ecitpid
pub:190572
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-13T12:58:50Z
ethz.rosetta.lastUpdated
2018-11-03T02:24:02Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
ethz.COinS
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