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dc.contributor.author
Ciappa, M.
dc.contributor.author
Malberti, P.
dc.contributor.author
Furcas, P.
dc.contributor.author
Vanzi, M.
dc.date.accessioned
2017-06-12T19:23:56Z
dc.date.available
2017-06-12T19:23:56Z
dc.date.issued
1998-06
dc.identifier.issn
0026-2714
dc.identifier.issn
1872-941X
dc.identifier.other
10.1016/S0026-2714(98)00078-X
dc.identifier.uri
http://hdl.handle.net/20.500.11850/127702
dc.language.iso
en
dc.publisher
Elsevier
dc.title
A new adaptive amplifier for biased electron beam induced current applications
dc.type
Journal Article
ethz.journal.title
Microelectronics Reliability
ethz.journal.volume
38
ethz.journal.issue
6-8
ethz.journal.abbreviated
Microelectron. reliab.
ethz.pages.start
889
ethz.pages.end
893
ethz.identifier.nebis
001933457
ethz.publication.place
Kidlingon
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03380 - Huang, Qiuting / Huang, Qiuting
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03380 - Huang, Qiuting / Huang, Qiuting
ethz.date.deposited
2017-06-12T19:24:36Z
ethz.source
ECIT
ethz.identifier.importid
imp59365533d741347580
ethz.ecitpid
pub:190573
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-15T02:34:35Z
ethz.rosetta.lastUpdated
2020-02-14T17:57:06Z
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=A%20new%20adaptive%20amplifier%20for%20biased%20electron%20beam%20induced%20current%20applications&rft.jtitle=Microelectronics%20Reliability&rft.date=1998-06&rft.volume=38&rft.issue=6-8&rft.spage=889&rft.epage=893&rft.issn=0026-2714&1872-941X&rft.au=Ciappa,%20M.&Malberti,%20P.&Furcas,%20P.&Vanzi,%20M.&rft.genre=article&rft_id=info:doi/10.1016/S0026-2714(98)00078-X&
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