Hard X-ray Photon-in Photon-out Spectroscopy as a Probe of the Temperature-Induced Delocalization of Electrons in Nanoscale Semiconductors

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Author
Hirsch, Ofer
Kvashnina, Kristina
Willa, Christoph
Koziej, Dorota
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Date
2017-02
Type
  • Journal Article
Publication status
published
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Journal / series
Chemistry of Materials
Volume
29(4)
Pages / Article No.
1461 - 1466
Publisher
American Chemical Society
Organisational unit
03763 - Niederberger, Markus / Niederberger, Markus  
Notes
Published online 12 February 2017.
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Citations
Cited 9 times in Web of Science
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yes
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