Hard X-ray Photon-in Photon-out Spectroscopy as a Probe of the Temperature-Induced Delocalization of Electrons in Nanoscale Semiconductors
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Date
2017-02Type
- Journal Article
Citations
Cited 10 times in
Web of Science
Cited 10 times in
Scopus
ETH Bibliography
yes
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Publication status
publishedExternal links
Journal / series
Chemistry of MaterialsVolume
Pages / Article No.
Publisher
American Chemical SocietyOrganisational unit
03763 - Niederberger, Markus / Niederberger, Markus
Notes
Published online 12 February 2017.More
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Citations
Cited 10 times in
Web of Science
Cited 10 times in
Scopus
ETH Bibliography
yes
Altmetrics