Hard X-ray Photon-in Photon-out Spectroscopy as a Probe of the Temperature-Induced Delocalization of Electrons in Nanoscale Semiconductors
Metadata only
Date
2017-02Type
- Journal Article
Publication status
publishedJournal / series
Chemistry of materialsVolume
Pages / Article No.
Publisher
American Chemical SocietyOrganisational unit
03763 - Niederberger, Markus
Notes
Published online 12 February 2017.More
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