Hard X-ray Photon-in Photon-out Spectroscopy as a Probe of the Temperature-Induced Delocalization of Electrons in Nanoscale Semiconductors - Research Collection

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Author

Hirsch, Ofer

Kvashnina, Kristina

Willa, Christoph

Koziej, Dorota

Date

2017-02

Type

Journal Article

Citations

Cited 8 times in Web of Science

Cited 9 times in Scopus

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1021/acs.chemmater.6b05218

Journal / series

Chemistry of materials

Volume

29(4)

Pages / Article No.

1461 - 1466

Publisher

American Chemical Society

Organisational unit

03763 - Niederberger, Markus / Niederberger, Markus

Notes

Published online 12 February 2017.

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Citations

Cited 8 times in Web of Science

Cited 9 times in Scopus

ETH Bibliography

yes

Altmetrics