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dc.contributor.author
Fukami, Aya
dc.contributor.author
Ghose, Saugata
dc.contributor.author
Luo, Yixin
dc.contributor.author
Cai, Yu
dc.contributor.author
Mutlu, Onur
dc.date.accessioned
2017-06-12T20:42:41Z
dc.date.available
2017-06-12T20:42:41Z
dc.date.issued
2017-03
dc.identifier.issn
1742-2876
dc.identifier.issn
1873-202X
dc.identifier.other
10.1016/j.diin.2017.01.011
dc.identifier.uri
http://hdl.handle.net/20.500.11850/130156
dc.language.iso
en
dc.publisher
Elsevier
dc.subject
Chip-off analysis
dc.subject
Digital forensics
dc.subject
Memory errors
dc.subject
Memory reliability
dc.subject
NAND flash memory analysis
dc.subject
Read-retry
dc.title
Improving the reliability of chip-off forensic analysis of NAND flash memory devices
dc.type
Journal Article
ethz.journal.title
Digital Investigation
ethz.journal.volume
20
ethz.pages.start
S1
ethz.pages.end
S11
ethz.notes
Published online 21 March 2017.
ethz.identifier.wos
ethz.identifier.scopus
ethz.identifier.nebis
005013515
ethz.publication.place
Amsterdam
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::09483 - Mutlu, Onur / Mutlu, Onur
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::09483 - Mutlu, Onur / Mutlu, Onur
ethz.date.deposited
2017-06-12T20:43:42Z
ethz.source
ECIT
ethz.identifier.importid
imp59365562ded4584710
ethz.ecitpid
pub:193158
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-15T18:49:29Z
ethz.rosetta.lastUpdated
2021-02-14T15:07:41Z
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=Improving%20the%20reliability%20of%20chip-off%20forensic%20analysis%20of%20NAND%20flash%20memory%20devices&rft.jtitle=Digital%20Investigation&rft.date=2017-03&rft.volume=20&rft.spage=S1&rft.epage=S11&rft.issn=1742-2876&1873-202X&rft.au=Fukami,%20Aya&Ghose,%20Saugata&Luo,%20Yixin&Cai,%20Yu&Mutlu,%20Onur&rft.genre=article&rft_id=info:doi/10.1016/j.diin.2017.01.011&
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