Non-MT Determination of X-Ray Absorption Cross-Section's Factorized Atomic Part in the Near-Edge Region

Application to Si K-Edge XANES Analysis in Beta-Zeolites
Thumbnail
Metadata only
Author
Bugaev, L. A.
van Bokhoven, Jeroen A.
Avakyan, L. A.
Latokha, Ya. V.
Show all
Date
2007
Type
  • Conference Paper
Publication status
published
External links
Full text via SFX
Editor
Hedman, Britt
Pianetta, Piero
Book title
X-Ray absorption fine structure : 13th international conference
Journal / series
AIP conference proceedings
Volume
882
Pages
117 - 119
Publisher
American Institute of Physics
Event
13th International Conference on X-ray Absorption Fine Structures 2006 (XAFS13), Stanford, California, USA, July 9-14, 2006
Organisational unit
03746 - Van Bokhoven, Jeroen A.
Notes
.
More
Show all metadata
Altmetrics