Non-MT Determination of X-Ray Absorption Cross-Section's Factorized Atomic Part in the Near-Edge Region: Application to Si K-Edge XANES Analysis in Beta-Zeolites

Metadata only

Author

Date

2007

Type

Conference Paper

ETH Bibliography

yes

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Publication status

published

External links

Editor

Book title

X-Ray absorption fine structure : 13th international conference

Journal / series

AIP Conference Proceedings

Volume

882

Pages / Article No.

117 - 119

Publisher

American Institute of Physics

Event

13th International Conference on X-ray Absorption Fine Structures 2006 (XAFS13), Standford, CA, USA, July 9-14, 2006

Organisational unit

03746 - Van Bokhoven, Jeroen A. / Van Bokhoven, Jeroen A.

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ETH Bibliography

yes

Altmetrics

Research Collection