Langfristige Lebensdaueruntersuchungen an p-n-p-legierten Ge-Transistoren

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Author
Villalaz, Carlos
Date
1966
Type
  • Doctoral Thesis
Rights / license
In Copyright - Non-Commercial Use Permitted
Permanent link
https://doi.org/10.3929/ethz-a-000087568
Publication status
published
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Contributors
Examiner: Linder, Arthur
Examiner: Strutt, Maximilian J. O.
Publisher
Juris
Subject
TRANSISTOREN (ELEKTRONIK); WECHSELFESTIGKEITSPRÜFUNG (MATERIALPRÜFUNG); TRANSISTORS (ELECTRONICS); REPEATED DYNAMIC STRESS TESTS (MATERIALS TESTING)
Notes
Diss. Techn.Wiss. ETH Zürich, Nr. 3866, 0000. Ref.: Strutt, M.J.O. ; Korref.: Linder, A..
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