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Author
Date
1966Type
- Doctoral Thesis
ETH Bibliography
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https://doi.org/10.3929/ethz-a-000087568Publication status
publishedExternal links
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JurisSubject
TRANSISTOREN (ELEKTRONIK); WECHSELFESTIGKEITSPRÜFUNG (MATERIALPRÜFUNG); TRANSISTORS (ELECTRONICS); REPEATED DYNAMIC STRESS TESTS (MATERIALS TESTING)Notes
Diss. Techn.Wiss. ETH Zürich, Nr. 3866, 0000. Ref.: Strutt, M.J.O. ; Korref.: Linder, A..More
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ETH Bibliography
yes
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