Langfristige Lebensdaueruntersuchungen an p-n-p-legierten Ge-Transistoren

Download
Abstract (PDF, 346.6Kb)
Fulltext (PDF, 9.578Mb)
Thumbnail
Closed access
Author
Villalaz, Carlos
Date
1966
Type
    Doctoral Thesis
Rights / license
In Copyright - Non-Commercial Use Permitted
Permanent link
https://doi.org/10.3929/ethz-a-000087568
Publication status
published
External links
Search print copy at ETH Library
Contributors
Examiner: Linder, Arthur
Examiner: Strutt, Maximilian J. O.
Publisher
Juris
Subject
TRANSISTOREN (ELEKTRONIK); WECHSELFESTIGKEITSPRÜFUNG (MATERIALPRÜFUNG); TRANSISTORS (ELECTRONICS); REPEATED DYNAMIC STRESS TESTS (MATERIALS TESTING)
Notes
Diss. Techn.Wiss. ETH Zürich, Nr. 3866, 0000. Ref.: Strutt, M.J.O. ; Korref.: Linder, A..
More
Show all metadata
ETH Bibliography
yes
Altmetrics