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dc.contributor.author
Villalaz, Carlos
dc.contributor.supervisor
Linder, Arthur
dc.contributor.supervisor
Strutt, Maximilian J. O.
dc.date.accessioned
2017-06-12T21:16:30Z
dc.date.available
2017-06-12T21:16:30Z
dc.date.issued
1966
dc.identifier.uri
http://hdl.handle.net/20.500.11850/131414
dc.identifier.doi
10.3929/ethz-a-000087568
dc.format
application/pdf
dc.language.iso
de
dc.publisher
Juris
dc.rights.uri
http://rightsstatements.org/page/InC-NC/1.0/
dc.subject
TRANSISTOREN (ELEKTRONIK)
dc.subject
WECHSELFESTIGKEITSPRÜFUNG (MATERIALPRÜFUNG)
dc.subject
TRANSISTORS (ELECTRONICS)
dc.subject
REPEATED DYNAMIC STRESS TESTS (MATERIALS TESTING)
dc.title
Langfristige Lebensdaueruntersuchungen an p-n-p-legierten Ge-Transistoren
dc.type
Doctoral Thesis
dc.rights.license
In Copyright - Non-Commercial Use Permitted
ethz.size
287 S.
ethz.code.ddc
DDC - DDC::6 - Technology, medicine and applied sciences::621.3 - Electric engineering
ethz.notes
Diss. Techn.Wiss. ETH Zürich, Nr. 3866, 0000. Ref.: Strutt, M.J.O. ; Korref.: Linder, A..
ethz.identifier.diss
3866
ethz.identifier.nebis
000087568
ethz.publication.place
Zürich
ethz.publication.status
published
ethz.date.deposited
2017-06-12T21:18:00Z
ethz.source
ECOL
ethz.identifier.importid
imp5936692a8cd2a24288
ethz.ecolpid
eth:31683
ethz.eth
yes
ethz.availability
Closed access
ethz.rosetta.installDate
2017-07-13T01:21:19Z
ethz.rosetta.lastUpdated
2020-02-14T18:22:31Z
ethz.rosetta.versionExported
true
ethz.COinS
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