Langzeit-Lebensdauerversuche an Leistungs=(p-n-p-n)=Thyristoren zur Ermittlung ihres Echtzeitverhaltens

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Author
Schwickardi, Gerhard
Date
1971
Type
  • Doctoral Thesis
Rights / license
In Copyright - Non-Commercial Use Permitted
Permanent link
https://doi.org/10.3929/ethz-a-000088574
Publication status
published
External links
Full text via SFX
Contributors
Supervisor: Strutt, Maximilian J. O.
Supervisor: Zwicky, Rudolf
Publisher
ETH Zürich
Subject
GLEICHRICHTER/KRISTALL-METALL-KONTAKT (ELEKTROTECHNIK); LEBENSDAUER/ELEKTROTECHNIK, ELEKTRONIK, MIKROELEKTRONIK, NACHRICHTENTECHNIK; RECTIFIERS/CRYSTAL-METAL CONTACT (ELECTRICAL ENGINEERING); DURABILITY, LIFE-CYCLE, LIFETIME (ELECTRICAL ENGINEERING, ELECTRONICS, MICROELECTRONICS, TELECOMMUNICATIONS)
Notes
Diss. Techn.Wiss. ETH Zürich, Nr. 4800, 0000. Ref.: Strutt, M.J.O. ; Korref.: Zwicky, R..
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