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dc.contributor.author
Hoffmann, Johannes Paul
dc.contributor.author
Leuchtmann, Pascal
dc.contributor.author
Kretz, Adjan
dc.contributor.author
Rüfenacht, Jürg
dc.contributor.author
Vahldieck, Rüdiger
dc.date.accessioned
2017-06-08T20:56:00Z
dc.date.available
2017-06-08T20:56:00Z
dc.date.issued
2008
dc.identifier.isbn
978-2-87487-006-4
dc.identifier.other
10.1109/EUMC.2008.4751451
dc.identifier.uri
http://hdl.handle.net/20.500.11850/13252
dc.language.iso
en
dc.publisher
IEEE
dc.title
Characterization of Coaxial Adapters for S-parameter Measurements
dc.type
Conference Paper
ethz.book.title
38th European Microwave Conference, 2008. EuMC 2008
ethz.pages.start
313
ethz.pages.end
316
ethz.event
38th European Microwave Conference, 2008 (EuMC 2008)
ethz.event.location
Amsterdam, Netherlands
ethz.event.date
October 27-31, 2008
ethz.notes
.
ethz.publication.place
Piscataway, NJ
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02140 - Departement Informationstechnologie und Elektrotechnik / Department of Information Technology and Electrical Engineering::02635 - Institut für Elektromagnetische Felder (IEF) / Electromagnetic Fields Laboratory (IEF)::03472 - Professur für Feldtheorie (ehemalig)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02140 - Departement Informationstechnologie und Elektrotechnik / Department of Information Technology and Electrical Engineering::02635 - Institut für Elektromagnetische Felder (IEF) / Electromagnetic Fields Laboratory (IEF)::03472 - Professur für Feldtheorie (ehemalig)
ethz.date.deposited
2017-06-08T20:56:21Z
ethz.source
ECIT
ethz.identifier.importid
imp59364c268bb9d79288
ethz.ecitpid
pub:24650
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T22:06:59Z
ethz.rosetta.lastUpdated
2017-07-12T22:06:59Z
ethz.rosetta.versionExported
true
ethz.COinS
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