The electronic structure of La1-xSrxMnO3 thin films and its Tc dependence as studied using angle-resolved photoemission

Shi, M.; Falub, M. C.; Willmott, P. R.; Krempasky, J.; Herger, R.; Patthey, L.; Hricovini, K.; Falub, C. V.; Schneider, M.

doi:10.1088/0953-8984/20/22/222001

Metadata only

Autor(in)

Shi, M.

Datum

2008

Typ

Journal Article

Zitate

4 Zitate in Web of Science

ETH Bibliographie

yes

Altmetrics

Publikationsstatus

published

Externe Links

https://doi.org/10.1088/0953-8984/20/22/222001

Suchen via swisscovery

Zeitschrift / Serie

Journal of Physics: Condensed Matter

Band

20(22)

Seiten / Artikelnummer

222001-1 - 222001-5

Verlag

Institute of Physics

Organisationseinheit

02509 - Laboratorium für Neutronenstreuung (LNS) / Laboratory for Neutron Scattering (LNS)

Anmerkungen

Print publication Issue 22 (4 June 2008). Received 20 March 2008.

Mehr

Alle Metadaten anzeigen

Zitate

4 Zitate in Web of Science

ETH Bibliographie

yes

Altmetrics

Research Collection

Suche

The electronic structure of La1-xSrxMnO3 thin films and its Tc dependence as studied using angle-resolved photoemission Mendeley CSV RIS BibTeX

The electronic structure of La1-xSrxMnO3 thin films and its Tc dependence as studied using angle-resolved photoemission

Mendeley

CSV

RIS

BibTeX