On the effect of the electrical contact resistance in nanodevices
dc.contributor.author
Schwamb, Timo
dc.contributor.author
Burg, Brian R.
dc.contributor.author
Schirmer, Niklas C.
dc.contributor.author
Poulikakos, Dimos
dc.date.accessioned
2017-06-08T21:08:08Z
dc.date.available
2017-06-08T21:08:08Z
dc.date.issued
2008
dc.identifier.issn
0003-6951
dc.identifier.issn
1077-3118
dc.identifier.other
10.1063/1.2946663
dc.identifier.uri
http://hdl.handle.net/20.500.11850/13732
dc.language.iso
en
dc.publisher
American Institute of Physics
dc.subject
carbon nanotubes
dc.subject
contact resistance
dc.subject
electrical resistivity
dc.subject
electron beam deposition
dc.subject
nanowires
dc.subject
platinum
dc.subject
point contacts
dc.subject
pressure sensors
dc.title
On the effect of the electrical contact resistance in nanodevices
dc.type
Journal Article
ethz.journal.title
Applied Physics Letters
ethz.journal.volume
92
ethz.journal.issue
24
ethz.journal.abbreviated
Appl. Phys. Lett.
ethz.pages.start
243106-1
ethz.pages.end
243106-3
ethz.notes
Received 20 February 2008. Accepted 24 May 2008. Published 17 June 2008..
ethz.identifier.wos
ethz.identifier.nebis
000038985
ethz.publication.place
Melville, NY
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::02668 - Inst. f. Energie- und Verfahrenstechnik / Inst. Energy and Process Engineering::03462 - Poulikakos, Dimos / Poulikakos, Dimos
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::02668 - Inst. f. Energie- und Verfahrenstechnik / Inst. Energy and Process Engineering::03462 - Poulikakos, Dimos / Poulikakos, Dimos
ethz.date.deposited
2017-06-08T21:08:28Z
ethz.source
ECIT
ethz.identifier.importid
imp59364c30a184778362
ethz.ecitpid
pub:25215
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-14T14:05:15Z
ethz.rosetta.lastUpdated
2022-03-28T08:12:15Z
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=On%20the%20effect%20of%20the%20electrical%20contact%20resistance%20in%20nanodevices&rft.jtitle=Applied%20Physics%20Letters&rft.date=2008&rft.volume=92&rft.issue=24&rft.spage=243106-1&rft.epage=243106-3&rft.issn=0003-6951&1077-3118&rft.au=Schwamb,%20Timo&Burg,%20Brian%20R.&Schirmer,%20Niklas%20C.&Poulikakos,%20Dimos&rft.genre=article&rft_id=info:doi/10.1063/1.2946663&
Files in this item
| Files | Size | Format | Open in viewer |
|---|---|---|---|
|
There are no files associated with this item. |
|||
Publication type
-
Journal Article [121986]