Feed-forward compensation of surface potential in atomic force microscopy - Research Collection

Metadata only

Author

Ziegler, Dominik

Naujoks, Nicola

Stemmer, Andreas

Date

2008

Type

Journal Article

Citations

Cited 15 times in Web of Science

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1063/1.2947740

Journal / series

Review of Scientific Instruments

Volume

79(6)

Pages / Article No.

063704-1 - 063704-4

Publisher

American Institute of Physics

Subject

atomic force microscopy; feedforward; surface charging; surface potential

Organisational unit

03444 - Stemmer, Andreas

Notes

Received 18 March 2008, Accepted 28 April 2008.

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Citations

Cited 15 times in Web of Science

ETH Bibliography

yes

Altmetrics