Feed-forward compensation of surface potential in atomic force microscopy

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Author
Ziegler, Dominik
Naujoks, Nicola
Stemmer, Andreas
Date
2008
Type
  • Journal Article
Publication status
published
External links
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Journal / series
Review of Scientific Instruments
Volume
79(6)
Pages
063704-1 - 063704-4
Publisher
American Institute of Physics
Subject
atomic force microscopy; feedforward; surface charging; surface potential
Organisational unit
03444 - Stemmer, Andreas
Notes
Received 18 March 2008, Accepted 28 April 2008.
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Citations
Cited 14 times in Web of Science
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