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Author
Date
1991Type
- Doctoral Thesis
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https://doi.org/10.3929/ethz-a-000592838Publication status
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ETH ZürichSubject
HALBLEITERBAUELEMENTE + ELEKTRONISCHE BAUELEMENTE (ELEKTRONIK); MODELLRECHNUNG/ELEKTROTECHNIK, ELEKTRONIK, NACHRICHTENTECHNIK, MIKROELEKTRONIK; ANORDNUNGEN GEOMETRISCHER GEBILDE (GEOMETRIE); LATCH-UP EFFEKT (MIKROELEKTRONIK); METAL OXIDE SEMICONDUCTOR-TRANSISTOREN, MOS (ELEKTRONIK); SEMICONDUCTOR COMPONENTS + ELECTRONIC COMPONENTS (ELECTRONICS); MATHEMATICAL MODELING IN ELECTRICAL ENGINEERING, ELECTRONICS, TELECOMMUNICATIONS, MICROELECTRONICS; ARRANGEMENTS OF GEOMETRIC FIGURES (GEOMETRY); LATCH-UP EFFECT (MICROELECTRONICS); METAL OXIDE SEMICONDUCTOR TRANSISTORS, MOS (ELECTRONICS)Notes
Diss. Techn. Wiss. ETH Zürich, Nr. 9383, 1991. Ref.: W. Fichtner ; Korref.: J. Nievergelt.More
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