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dc.contributor.author
Bonnenberg, Heinz
dc.contributor.supervisor
Fichtner, Wolfgang
dc.contributor.supervisor
Massey, James
dc.date.accessioned
2017-06-13T01:16:53Z
dc.date.available
2017-06-13T01:16:53Z
dc.date.issued
1993
dc.identifier.uri
http://hdl.handle.net/20.500.11850/141267
dc.identifier.doi
10.3929/ethz-a-000904787
dc.format
application/pdf
dc.language.iso
en
dc.publisher
ETH Zürich
dc.rights.uri
http://rightsstatements.org/page/InC-NC/1.0/
dc.subject
KRYPTOGRAPHIE (INFORMATIONSTHEORIE)
dc.subject
HÖCHSTINTEGRIERTE SCHALTUNGEN, VLSI (MIKROELEKTRONIK)
dc.subject
SELBSTTEST, BIST (MIKROELEKTRONIK)
dc.subject
CRYPTOGRAPHY (INFORMATION THEORY)
dc.subject
VERY LARGE SCALE INTEGRATED CIRCUITS, VLSI (MICROELECTRONICS)
dc.subject
SELF-TEST + BUILT-IN-SELF-TEST, BIST (MICROELECTRONICS)
dc.title
Secure testing of VLSI cryptrographic equipment
dc.type
Doctoral Thesis
dc.rights.license
In Copyright - Non-Commercial Use Permitted
ethz.size
XVII, 121 S.
ethz.code.ddc
5 - Science::510 - Mathematics
ethz.notes
Diss. Techn. Wiss. ETH Zürich, Nr. 10204, 1993. Ref.: W. Fichtner ; Korref.: J. L. Massey.
ethz.identifier.diss
10204
ethz.identifier.nebis
000904787
ethz.publication.place
Zürich
ethz.publication.status
published
ethz.date.deposited
2017-06-13T01:17:28Z
ethz.source
ECOL
ethz.identifier.importid
imp593669e913ca783711
ethz.ecolpid
eth:39076
ethz.eth
yes
ethz.availability
Closed access
ethz.rosetta.installDate
2017-07-17T08:57:29Z
ethz.rosetta.lastUpdated
2018-11-03T18:03:53Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
ethz.COinS
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