Analyse von Spurenelementen mit Beschleuniger-Sekundärionen-Massenspektrometrie

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Author
Ender, Rainer Markus
Date
1997
Type
    Doctoral Thesis
Rights / license
In Copyright - Non-Commercial Use Permitted
Permanent link
https://doi.org/10.3929/ethz-a-001793727
Publication status
published
External links
Search print copy at ETH Library
Contributors
Examiner: Lang, Jürg
Publisher
ETH Zürich
Subject
SEKUNDÄRIONEN-MASSENSPEKTROMETRIE, SIMS; SPURENELEMENTE (CHEMIE); SPUTTERING MIT ELEKTRONENSTRAHLEN (ELEKTRODYNAMIK); SECONDARY IONS MASS SPECTROMETRY, SIMS; TRACE ELEMENTS (CHEMISTRY); ELECTRON-BEAM SPUTTERING (ELECTRODYNAMICS)
Notes
Diss. Naturwiss. ETH Zürich, Nr. 12213, 1997. Ref.: J. Lang ; Korref.: E. Nolte ; Korref.: M. Suter.
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