Methods to measure and modify electrical properties on a nanometer scale and their applications in science and technology

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Author
Jacobs, Heinrich Otto Heiko
Date
1999
Type
    Doctoral Thesis
Rights / license
In Copyright - Non-Commercial Use Permitted
Permanent link
https://doi.org/10.3929/ethz-a-002049756
Publication status
published
External links
Search print copy at ETH Library
Contributors
Examiner: Bächtold, Werner
Examiner: Stemmer, Andreas
Publisher
ETH Zürich
Subject
NANOSTRUKTUR (PHYSIK DER KONDENSIERTEN MATERIE); ELEKTRISCHE UND DIELEKTRISCHE EIGENSCHAFTEN DÜNNER SCHICHTEN (PHYSIK VON MOLEKULARSYSTEMEN); MESSMETHODEN, MESSTECHNIK FÜR OBERFLÄCHEN (PHYSIK VON MOLEKULARSYSTEMEN); RASTERSONDENMIKROSKOPE, RSM + RASTERSONDENMIKROSKOPIE; NANOSTRUCTURE (CONDENSED MATTER PHYSICS); ELECTRICAL AND DIELECTRICAL PROPERTIES OF THIN FILMS (PHYSICS OF MOLECULAR SYSTEMS); MEASUREMENT METHODS, TECHNIQUES FOR SURFACES (PHYSICS OF MOLECULAR SYSTEMS); SCANNING PROBE MICROSCOPES, SPM + SCANNING PROBE MICROSCOPY
Organisational unit
03444 - Stemmer, Andreas / Stemmer, Andreas  
Notes
Diss. Techn. Wiss. ETH Zürich, Nr. 13016, 1999. Ref.: Andreas Stemmer ; Korref.: Werner Bächtold.
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