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dc.contributor.author
Döbeli, M.
dc.date.accessioned
2017-06-08T21:28:37Z
dc.date.available
2017-06-08T21:28:37Z
dc.date.issued
2008
dc.identifier.issn
0953-8984
dc.identifier.issn
1361-648X
dc.identifier.other
10.1088/0953-8984/20/26/264010
dc.identifier.uri
http://hdl.handle.net/20.500.11850/14751
dc.language.iso
en
dc.publisher
Institute of Physics
dc.title
Characterization of oxide films by MeV ion beam techniques
dc.type
Journal Article
ethz.journal.title
Journal of Physics. Condensed Matter
ethz.journal.volume
20
ethz.journal.issue
26
ethz.journal.abbreviated
J. phys., Condens. matter
ethz.pages.start
264010-1
ethz.pages.end
264010-7
ethz.notes
Received 19 November 2007, In final form 21 February 2008, Published 9 June 2008.
ethz.identifier.wos
ethz.identifier.nebis
000510644
ethz.publication.place
Bristol
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02010 - Departement Physik / Department of Physics::02532 - Institut für Teilchenphysik (IPP) / Institute for Particle Physics (IPP)::08619 - Labor für Ionenstrahlphysik (LIP)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02010 - Departement Physik / Department of Physics::02532 - Institut für Teilchenphysik (IPP) / Institute for Particle Physics (IPP)::08619 - Labor für Ionenstrahlphysik (LIP)
ethz.date.deposited
2017-06-08T21:28:42Z
ethz.source
ECIT
ethz.identifier.importid
imp59364c44dad5654377
ethz.ecitpid
pub:26431
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T21:54:39Z
ethz.rosetta.lastUpdated
2018-08-02T05:11:13Z
ethz.rosetta.versionExported
true
ethz.COinS
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