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dc.contributor.author
Döbeli, M.
dc.date.accessioned
2017-06-08T21:28:37Z
dc.date.available
2017-06-08T21:28:37Z
dc.date.issued
2008
dc.identifier.issn
0953-8984
dc.identifier.issn
1361-648X
dc.identifier.other
10.1088/0953-8984/20/26/264010
dc.identifier.uri
http://hdl.handle.net/20.500.11850/14751
dc.language.iso
en
dc.publisher
Institute of Physics
dc.title
Characterization of oxide films by MeV ion beam techniques
dc.type
Journal Article
ethz.journal.title
Journal of Physics: Condensed Matter
ethz.journal.volume
20
ethz.journal.issue
26
ethz.journal.abbreviated
J. phys., Condens. matter
ethz.pages.start
264010-1
ethz.pages.end
264010-7
ethz.notes
Received 19 November 2007, In final form 21 February 2008, Published 9 June 2008.
ethz.identifier.wos
ethz.identifier.nebis
000510644
ethz.publication.place
Bristol
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02532 - Institut für Teilchen- und Astrophysik / Inst. Particle Physics and Astrophysics::08619 - Labor für Ionenstrahlphysik (LIP)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02532 - Institut für Teilchen- und Astrophysik / Inst. Particle Physics and Astrophysics::08619 - Labor für Ionenstrahlphysik (LIP)
ethz.date.deposited
2017-06-08T21:28:42Z
ethz.source
ECIT
ethz.identifier.importid
imp59364c44dad5654377
ethz.ecitpid
pub:26431
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T21:54:39Z
ethz.rosetta.lastUpdated
2018-10-01T07:02:18Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
ethz.COinS
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