The potential of accelerator secondary ion mass spectrometry in environmental sciences

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Author
Maden, Colin
Date
2003
Type
    Doctoral Thesis
Rights / license
In Copyright - Non-Commercial Use Permitted
Permanent link
https://doi.org/10.3929/ethz-a-004598699
Publication status
published
External links
Search print copy at ETH Library
Contributors
Examiner: Eichler, Ralph
Examiner: Kutschera, Walter
Examiner: Suter, Martin
Publisher
ETH Zürich
Subject
SEKUNDÄRIONEN-MASSENSPEKTROMETRIE, SIMS; UMWELTANALYTIK UND ENTSPRECHENDE UNTERSUCHUNGSMETHODEN UND -TECHNIKEN (UMWELTSCHUTZ); SECONDARY IONS MASS SPECTROMETRY, SIMS; ENVIRONMENTAL ANALYTICS AND CORRESPONDING TECHNOLOGY AND METHODOLOGY (ENVIRONMENTAL PROTECTION)
Organisational unit
03284 - Eichler, Ralph
Notes
Diss., Naturwissenschaften ETH Zürich, Nr. 15046, 2003.
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