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dc.contributor.author
Castellazzi, A.
dc.contributor.author
Ciappa, M.
dc.contributor.editor
Groeseneken, Guido
dc.date.accessioned
2017-06-08T21:30:48Z
dc.date.available
2017-06-08T21:30:48Z
dc.date.issued
2008
dc.identifier.issn
0026-2714
dc.identifier.issn
1872-941X
dc.identifier.other
10.1016/j.microrel.2008.07.041
dc.identifier.uri
http://hdl.handle.net/20.500.11850/14835
dc.language.iso
en
dc.publisher
Elsevier
dc.title
Novel simulation approach for transient analysis and reliable thermal management of power devices
dc.type
Conference Paper
ethz.book.title
19th European symposium on reliability of electron devices, failure physics and analysis
ethz.journal.title
Microelectronics Reliability
ethz.journal.volume
48
ethz.journal.issue
8-9
ethz.journal.abbreviated
Microelectron. reliab.
ethz.pages.start
1500
ethz.pages.end
1504
ethz.event
19th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2008)
ethz.event.date
September 29-October 2, 2008
ethz.notes
Received 30 June 2008, Available online 21 August 2008, Published August-September 2008.
ethz.identifier.nebis
001933457
ethz.publication.place
Kidlington, Oxford
ethz.publication.status
published
ethz.leitzahl
03228 - Fichtner, Wolfgang
ethz.leitzahl.certified
03228 - Fichtner, Wolfgang
ethz.date.deposited
2017-06-08T21:30:56Z
ethz.source
ECIT
ethz.identifier.importid
imp59364c467705126418
ethz.ecitpid
pub:26527
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-26T05:10:58Z
ethz.rosetta.lastUpdated
2017-11-01T11:15:57Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
ethz.COinS
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