Genetic analysis and early testing of Stagonospora nodorum blotch resistance in hexaploid wheat

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Author
Aguilar, Victor
Date
2004
Type
    Doctoral Thesis
Rights / license
In Copyright - Non-Commercial Use Permitted
Permanent link
https://doi.org/10.3929/ethz-a-004959829
Publication status
published
External links
Search print copy at ETH Library
Contributors
Examiner: Schmid, Jürg Erwin
Examiner: Stamp, Peter
Publisher
ETH
Subject
RESISTENZGENE (GENETIK); TRITICUM AESTIVUM, BROTWEIZEN (PFLANZENBAU); DINKEL (PFLANZENBAU); RESISTENZ UND VITALITÄT VON KULTURPFLANZEN (PHYTOMEDIZIN); PARASTAGONOSPORA NODORUM + SPELZENBRÄUNE (PHYTOPATHOLOGIE); GENANALYSE (GENETISCHE TECHNIKEN); RESISTANCE GENES (GENETICS); TRITICUM AESTIVUM, BREAD WHEAT (CROP PRODUCTION); SPELT WHEAT (CROP PRODUCTION); RESISTANCE AND VITALITY OF CULTIVATED PLANTS (PLANT PATHOLOGY); PARASTAGONOSPORA NODORUM + GLUME BLOTCH (PLANT PATHOLOGY); GENE ANALYSIS (GENETIC TECHNIQUES)
Organisational unit
03265 - Stamp, Peter
Notes
Diss., Naturwissenschaften, Eidgenössische Technische Hochschule ETH Zürich, Nr. 15628, 2005.
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