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dc.contributor.author
Scagnoli, Valerio
dc.contributor.supervisor
Veen, Johannes Friso <<van der>>
dc.date.accessioned
2017-06-13T05:14:51Z
dc.date.available
2017-06-13T05:14:51Z
dc.date.issued
2005
dc.identifier.uri
http://hdl.handle.net/20.500.11850/149088
dc.identifier.doi
10.3929/ethz-a-005133594
dc.format
application/pdf
dc.language.iso
en
dc.publisher
ETH
dc.rights.uri
http://rightsstatements.org/page/InC-NC/1.0/
dc.subject
KRISTALLSTRUKTURANALYSE MIT RÖNTGENSTRAHLEN
dc.subject
MIKROSTRUKTUR VON MOLEKULARSYSTEMEN (PHYSIK)
dc.subject
ANTIFERROMAGNETISCHE WERKSTOFFE
dc.subject
PEROWSKITGITTER (KRISTALLOGRAPHIE)
dc.subject
X-RAY CRYSTAL STRUCTURE ANALYSIS
dc.subject
MICROSTRUCTURE OF MOLECULAR SYSTEMS (PHYSICS)
dc.subject
ANTIFERROMAGNETIC MATERIALS
dc.subject
PEROVSKITE LATTICE (CRYSTALLOGRAPHY)
dc.title
Electronic and magnetic ordering phenomena at metal-insulator transitions probed by resonant X-ray scattering
dc.type
Doctoral Thesis
dc.rights.license
In Copyright - Non-Commercial Use Permitted
ethz.size
104 S.
ethz.code.ddc
DDC - DDC::5 - Science::530 - Physics
ethz.notes
Diss., Naturwissenschaften, Eidgenössische Technische Hochschule ETH Zürich, Nr. 16412, 2006.
ethz.identifier.diss
16412
ethz.identifier.nebis
005133594
ethz.publication.place
Zürich
ethz.publication.status
published
ethz.leitzahl
03562 - Van der Veen, Johannes
ethz.date.deposited
2017-06-13T05:15:11Z
ethz.source
ECOL
ethz.identifier.importid
imp59366a960ac5195051
ethz.ecolpid
eth:28436
ethz.eth
yes
ethz.availability
Closed access
ethz.rosetta.installDate
2017-08-02T10:34:00Z
ethz.rosetta.lastUpdated
2020-02-15T02:25:43Z
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&amp;rft_val_fmt=info:ofi/fmt:kev:mtx:journal&amp;rft.atitle=Electronic%20and%20magnetic%20ordering%20phenomena%20at%20metal-insulator%20transitions%20probed%20by%20resonant%20X-ray%20scattering&amp;rft.date=2005&amp;rft.au=Scagnoli,%20Valerio&amp;rft.genre=unknown&amp;rft.btitle=Electronic%20and%20magnetic%20ordering%20phenomena%20at%20metal-insulator%20transitions%20probed%20by%20resonant%20X-ray%20scattering
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