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dc.contributor.author
Sponton, Luca
dc.contributor.supervisor
Fichtner, Wolfgang
dc.contributor.supervisor
Jaouen, Hervé
dc.date.accessioned
2017-12-08T10:52:42Z
dc.date.available
2017-06-13T06:14:45Z
dc.date.available
2017-12-08T10:52:42Z
dc.date.issued
2007
dc.identifier.uri
http://hdl.handle.net/20.500.11850/150395
dc.identifier.doi
10.3929/ethz-a-005572097
dc.language.iso
en
en_US
dc.publisher
ETH
en_US
dc.rights.uri
http://rightsstatements.org/page/InC-NC/1.0/
dc.subject
TRANSIENTENANALYSE (ELEKTROTECHNIK)
en_US
dc.subject
TRANSIENT ANALYSIS (ELECTRICAL ENGINEERING)
en_US
dc.subject
SCHALTKREISENTWURF (MIKROELEKTRONIK)
en_US
dc.subject
CIRCUIT ANALYSIS (ELECTRICAL ENGINEERING)
en_US
dc.subject
SCHALTKREISANALYSE (ELEKTROTECHNIK)
en_US
dc.subject
CIRCUIT DESIGN (MICROELECTRONICS)
en_US
dc.title
From manufacturing variability to process-aware circuit simulation
en_US
dc.type
Doctoral Thesis
dc.rights.license
In Copyright - Non-Commercial Use Permitted
ethz.size
1 Band
en_US
ethz.code.ddc
6 - Technology, medicine and applied sciences::621.3 - Electric engineering
en_US
ethz.identifier.diss
17444
en_US
ethz.identifier.nebis
005572097
ethz.publication.place
Zürich
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
03228 - Fichtner, Wolfgang
en_US
ethz.date.deposited
2017-06-13T06:15:17Z
ethz.source
ECOL
ethz.source
ECIT
ethz.identifier.importid
imp59364cd866fc237546
ethz.identifier.importid
imp59366abda628f39958
ethz.ecolpid
eth:30423
ethz.ecitpid
pub:34876
ethz.eth
yes
en_US
ethz.availability
Closed access
en_US
ethz.rosetta.installDate
2017-07-15T08:19:35Z
ethz.rosetta.lastUpdated
2017-12-08T10:52:46Z
ethz.rosetta.exportRequired
false
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=From%20manufacturing%20variability%20to%20process-aware%20circuit%20simulation&rft.date=2007&rft.au=Sponton,%20Luca&rft.genre=unknown&
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