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dc.contributor.author
Küng, Bruno
dc.contributor.author
Gustavsson, Simon
dc.contributor.author
Choi, Theodore
dc.contributor.author
Shorubalko, Ivan
dc.contributor.author
Pfäffli, Oliver
dc.contributor.author
Hassler, Fabian
dc.contributor.author
Blatter, Gianni
dc.contributor.author
Reinwald, Matthias
dc.contributor.author
Wegscheider, Werner
dc.contributor.author
Schön, Silke
dc.contributor.author
Ihn, Thomas Markus
dc.contributor.author
Ensslin, Klaus
dc.date.accessioned
2019-09-03T14:03:49Z
dc.date.available
2017-06-14T09:48:39Z
dc.date.available
2019-09-03T14:03:49Z
dc.date.issued
2010-07-29
dc.identifier.issn
1099-4300
dc.identifier.other
10.3390/e12071721
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/156496
dc.identifier.doi
10.3929/ethz-b-000156496
dc.description.abstract
Charge sensing with quantum point-contacts (QPCs) is a technique widely used in semiconductor quantum-dot research. Understanding the physics of this measurement process, as well as finding ways of suppressing unwanted measurement back-action, are therefore both desirable. In this article, we present experimental studies targeting these two goals. Firstly, we measure the effect of a QPC on electron tunneling between two InAs quantum dots, and show that a model based on the QPC’s shot-noise can account for it. Secondly, we discuss the possibility of lowering the measurement current (and thus the back-action) used for charge sensing by correlating the signals of two independent measurement channels. The performance of this method is tested in a typical experimental setup.
en_US
dc.format
application/pdf
en_US
dc.language.iso
en
en_US
dc.publisher
MDPI
en_US
dc.rights.uri
http://creativecommons.org/licenses/by/3.0/
dc.subject
Quantum dots
en_US
dc.subject
Quantum wires
en_US
dc.subject
Noise
en_US
dc.subject
Single-electron tunneling
en_US
dc.title
Measurement Back-Action in Quantum Point-Contact Charge Sensing
en_US
dc.type
Journal Article
dc.rights.license
Creative Commons Attribution 3.0 Unported
ethz.journal.title
Entropy
ethz.journal.volume
12
en_US
ethz.journal.issue
7
en_US
ethz.journal.abbreviated
Entropy
ethz.pages.start
1721
en_US
ethz.pages.end
1732
en_US
ethz.version.deposit
publishedVersion
en_US
ethz.identifier.wos
ethz.identifier.nebis
004152452
ethz.publication.place
Basel
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02505 - Laboratorium für Festkörperphysik / Laboratory for Solid State Physics::03439 - Ensslin, Klaus / Ensslin, Klaus
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02505 - Laboratorium für Festkörperphysik / Laboratory for Solid State Physics::03833 - Wegscheider, Werner / Wegscheider, Werner
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02511 - Institut für Theoretische Physik / Institute for Theoretical Physics::03369 - Blatter, Johann W. / Blatter, Johann W.
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02505 - Laboratorium für Festkörperphysik / Laboratory for Solid State Physics::03439 - Ensslin, Klaus / Ensslin, Klaus::08835 - Ihn, Thomas (Tit.-Prof.)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02505 - Laboratorium für Festkörperphysik / Laboratory for Solid State Physics::03439 - Ensslin, Klaus / Ensslin, Klaus
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02505 - Laboratorium für Festkörperphysik / Laboratory for Solid State Physics::03833 - Wegscheider, Werner / Wegscheider, Werner
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02511 - Institut für Theoretische Physik / Institute for Theoretical Physics::03369 - Blatter, Johann W. / Blatter, Johann W.
ethz.date.deposited
2017-06-14T09:52:59Z
ethz.source
ECIT
ethz.identifier.importid
imp59364cd4bb26169349
ethz.ecitpid
pub:34598
ethz.eth
yes
en_US
ethz.availability
Open access
en_US
ethz.rosetta.installDate
2017-07-12T21:54:20Z
ethz.rosetta.lastUpdated
2019-09-03T14:04:01Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=Measurement%20Back-Action%20in%20Quantum%20Point-Contact%20Charge%20Sensing&rft.jtitle=Entropy&rft.date=2010-07-29&rft.volume=12&rft.issue=7&rft.spage=1721&rft.epage=1732&rft.issn=1099-4300&rft.au=K%C3%BCng,%20Bruno&Gustavsson,%20Simon&Choi,%20Theodore&Shorubalko,%20Ivan&Pf%C3%A4ffli,%20Oliver&rft.genre=article&
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