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dc.contributor.author
Hueger, E.
dc.contributor.author
Schmidt, H.
dc.contributor.author
Stahn, J.
dc.contributor.author
Braunschweig, B.
dc.contributor.author
Geckle, U.
dc.contributor.author
Bruns, M.
dc.contributor.author
Markwitz, A.
dc.date.accessioned
2017-06-14T10:03:24Z
dc.date.available
2017-06-14T10:03:24Z
dc.date.issued
2009-12
dc.identifier.issn
1098-0121
dc.identifier.issn
0163-1829
dc.identifier.issn
1550-235X
dc.identifier.issn
0556-2805
dc.identifier.issn
2469-9969
dc.identifier.issn
1095-3795
dc.identifier.issn
2469-9950
dc.identifier.other
10.1103/PhysRevB.80.220101
dc.identifier.uri
http://hdl.handle.net/20.500.11850/156581
dc.language.iso
en
dc.publisher
American Physical Society
dc.title
Atomic transport in metastable compounds
dc.type
Journal Article
ethz.title.subtitle
Case study of self-diffusion in Si-C-N films using neutron reflectometry
ethz.journal.title
Physical Review B
ethz.journal.volume
80
ethz.journal.issue
22
ethz.journal.abbreviated
Phys. Rev., B
ethz.pages.start
220101
ethz.size
4 p.
ethz.notes
Received 26 August 2009, Published 9 December 2009.
ethz.identifier.wos
ethz.identifier.nebis
001888782
ethz.publication.place
Ridge, NY
ethz.publication.status
published
ethz.date.deposited
2017-06-14T10:10:20Z
ethz.source
ECIT
ethz.identifier.importid
imp59364cd677bb982443
ethz.ecitpid
pub:34776
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T20:57:34Z
ethz.rosetta.lastUpdated
2022-03-28T16:33:31Z
ethz.rosetta.versionExported
true
ethz.COinS
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