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dc.contributor.author
Stemmer, A.
dc.contributor.author
Ziegler, D.
dc.contributor.author
Seemann, L.
dc.contributor.author
Rychen, J.
dc.contributor.author
Naujoks, N.
dc.date.accessioned
2017-06-14T11:01:31Z
dc.date.available
2017-06-14T11:01:31Z
dc.date.issued
2008
dc.identifier.issn
1742-6588
dc.identifier.issn
1742-6596
dc.identifier.other
10.1088/1742-6596/142/1/012048
dc.identifier.uri
http://hdl.handle.net/20.500.11850/156726
dc.language.iso
en
dc.publisher
Institute of Physics
dc.title
Electric charges and forces in atomic force microscopy and nano-xerography
dc.type
Conference Paper
ethz.journal.title
Journal of Physics. Conference Series
ethz.journal.volume
142
ethz.journal.issue
1
ethz.journal.abbreviated
J. Phys.: Conf. Ser.
ethz.pages.start
012048
ethz.size
5 p.
ethz.event
Electrostatics 2007
ethz.event.location
Oxford, UK
ethz.event.date
March 25-29, 2007
ethz.notes
.
ethz.identifier.wos
ethz.identifier.nebis
004903140
ethz.publication.place
Unknown
ethz.publication.status
published
ethz.date.deposited
2017-06-14T11:10:33Z
ethz.source
ECIT
ethz.identifier.importid
imp59364cd9b663d53563
ethz.ecitpid
pub:34957
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T22:30:27Z
ethz.rosetta.lastUpdated
2018-12-02T07:20:45Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
ethz.COinS
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