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dc.contributor.author
Wermelinger, Thomas
dc.contributor.author
Scott, Shelley A.
dc.contributor.author
Lagally, Max G.
dc.contributor.author
Hinderling, Christian
dc.contributor.author
Spoleank, Ralph
dc.contributor.editor
Champion, Paul M.
dc.contributor.editor
Ziegler, Lawrence David
dc.date.accessioned
2017-06-14T13:17:37Z
dc.date.available
2017-06-14T13:17:37Z
dc.date.issued
2010-08-06
dc.identifier.isbn
978-0-7354-0818-0
dc.identifier.issn
0094-243X
dc.identifier.other
10.1063/1.3482804
dc.identifier.uri
http://hdl.handle.net/20.500.11850/157802
dc.language.iso
en
dc.publisher
American Institute of Physics
dc.title
High Lateral Resolution Analysis Of Stresses In Silver Thin Films By Means Of Raman Microscopy
dc.type
Other Conference Item
ethz.book.title
XXII International Conference on Raman Spectroscopy
ethz.journal.title
AIP Conference Proceedings
ethz.journal.volume
1267
ethz.journal.abbreviated
AIP conf. proc.
ethz.pages.start
776
ethz.pages.end
777
ethz.event
22nd International Conference on Raman Spectroscopy
ethz.event.location
Boston, MA, USA
ethz.event.date
August 8-13, 2010
ethz.notes
.
ethz.identifier.wos
ethz.identifier.nebis
000025027
ethz.publication.place
Melville, N.Y.
ethz.publication.status
published
ethz.date.deposited
2017-06-14T13:20:44Z
ethz.source
ECIT
ethz.identifier.importid
imp59364cef930c928726
ethz.ecitpid
pub:36204
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-14T17:54:34Z
ethz.rosetta.lastUpdated
2017-11-01T12:29:11Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
ethz.COinS
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