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dc.contributor.author
Müsing, A.
dc.contributor.author
Ortiz, G.
dc.contributor.author
Kolar, Johann W.
dc.date.accessioned
2017-06-14T16:27:18Z
dc.date.available
2017-06-14T16:27:18Z
dc.date.issued
2010
dc.identifier.isbn
978-1-4244-5394-8
dc.identifier.other
10.1109/IPEC.2010.5543573
dc.identifier.uri
http://hdl.handle.net/20.500.11850/159301
dc.language.iso
en
dc.publisher
IEEE
dc.subject
IGBT Press-pack IGBT current unbalance
dc.subject
Partial Element Equivalent Circuit (PEEC) method
dc.subject
loss modeling
dc.title
Optimization of the Current Distribution in Press-Pack High Power IGBT Modules
dc.type
Conference Paper
ethz.journal.title
International Power Electronics Conference (IPEC), 2010 : ECCE Asia ; 21 - 24 June 2010, Sapporo Convention Center, Sapporo, Japan
ethz.pages.start
1139
ethz.pages.end
1146
ethz.event
2010 International Power Electronics Conference (IPEC)
ethz.event.location
Sapporo, Japan
ethz.event.date
June 21-23, 2010
ethz.publication.place
Piscataway, NJ
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::03573 - Kolar, Johann W. / Kolar, Johann W.
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::03573 - Kolar, Johann W. / Kolar, Johann W.
ethz.date.deposited
2017-06-14T16:28:56Z
ethz.source
ECIT
ethz.identifier.importid
imp59364d586acd836648
ethz.ecitpid
pub:43604
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-15T05:43:49Z
ethz.rosetta.lastUpdated
2018-11-05T11:07:01Z
ethz.rosetta.versionExported
true
ethz.COinS
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