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dc.contributor.author
Horikawa, Sosuke
dc.contributor.author
Badertscher, L.
dc.contributor.author
Kaufmann, L.
dc.contributor.author
Laffranchi, M.
dc.contributor.author
Marchionni, Alberto
dc.contributor.author
Messina, M.
dc.contributor.author
Natterer, Gustav
dc.contributor.author
Rubbia, André
dc.date.accessioned
2017-06-14T17:01:09Z
dc.date.available
2017-06-14T17:01:09Z
dc.date.issued
2011
dc.identifier.issn
1742-6588
dc.identifier.issn
1742-6596
dc.identifier.other
10.1088/1742-6596/308/1/012027
dc.identifier.uri
http://hdl.handle.net/20.500.11850/159608
dc.language.iso
en
dc.publisher
Institute of Physics
dc.title
Feasibility of high-voltage systems for a very long drift in liquid argon TPCs
dc.type
Conference Paper
ethz.journal.title
Journal of Physics: Conference Series
ethz.journal.volume
308
ethz.journal.issue
1
ethz.journal.abbreviated
J. Phys.: Conf. Ser.
ethz.pages.start
012027
ethz.size
8 p.
ethz.event
1st International Workshop Towards the Giant Liquid Argon Charge Imaging Experiment
ethz.event.location
Tsukuba, Japan
ethz.event.date
March 29-31, 2010
ethz.identifier.wos
ethz.identifier.nebis
004903140
ethz.publication.place
Bristol
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02532 - Institut für Teilchen- und Astrophysik / Inst. Particle Physics and Astrophysics::03503 - Rubbia, André / Rubbia, André
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02532 - Institut für Teilchen- und Astrophysik / Inst. Particle Physics and Astrophysics::03503 - Rubbia, André / Rubbia, André
ethz.date.deposited
2017-06-14T17:06:57Z
ethz.source
ECIT
ethz.identifier.importid
imp59364d5dd156594590
ethz.ecitpid
pub:44073
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-15T05:02:54Z
ethz.rosetta.lastUpdated
2020-02-15T05:15:41Z
ethz.rosetta.versionExported
true
ethz.COinS
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