Comprehensive Comparison of Various Techniques for the Analysis of Elemental Distributions in Thin Films

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Author
Abou-Ras, D.
Caballero, R.
Fischer, C.H.
Kaufmann, C.A.
Lauermann, I.
Mainz, R.
Monig, H.
Schopke, A.
Stephan, C.
Streeck, C.
Schorr, S.
Eicke, A.
Dobeli, M.
Gade, B.
Hinrichs, J.
Nunney, T.
Dijkstra, H.
Hoffmann, V.
Klemm, D.
Efimova, V.
Bergmaier, A.
Dollinger, G.
Wirth, T.
Unger, W.
Rockett, A.A.
Perez-Rodriguez, A.
Alvarez-Garcia, J.
Izquierdo-Roca, V.
Schmid, T.
Choi, P.P.
Muller, M.
Bertram, F.
Christen, J.
Khatri, H.
Collins, R.W.
Marsillac, S.
Kotschau, I.
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Date
2011
Type
    Journal Article
Rights / license
In Copyright - Non-Commercial Use Permitted
Permanent link
https://doi.org/10.3929/ethz-b-000160072
Publication status
published
External links
Journal / series
Microscopy and Microanalysis
Volume
17(5)
Pages / Article No.
728 - 751
Publisher
Cambridge University Press
Subject
Elemental distributions; Comparison; Depth profiling; Chemical mapping; Thin films; Solar cells; Chalcopyrite-type; Cu(In,Ga)Se(2)
Organisational unit
08619 - Labor für Ionenstrahlphysik (LIP) / Laboratory of Ion Beam Physics (LIP)  
Notes
Received 05 November 2010, Accepted 04 April 2011. It was possible to publish this article open access thanks to a Swiss National Licence with the publisher
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Cited 68 times in Web of Science
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