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dc.contributor.author
Strecha, Christoph
dc.contributor.author
Fransens, Rik
dc.contributor.author
Van Gool, Luc
dc.contributor.editor
IEEE
dc.date.accessioned
2017-06-14T19:19:29Z
dc.date.available
2017-06-14T19:19:29Z
dc.date.issued
2006
dc.identifier.isbn
0-7695-2597-0
dc.identifier.isbn
978-1-424-43631-6
dc.identifier.other
10.1109/CVPR.2006.78
dc.identifier.uri
http://hdl.handle.net/20.500.11850/160420
dc.language.iso
en
dc.publisher
IEEE
dc.title
Combined depth and outlier estimation in multi-view stereo
dc.type
Conference Paper
ethz.book.title
Conference on Computer Vision and Pattern Recognition workshop, 2006 : CVPR 2006 ; New York City, New York, 17 - 22 June, 2006
ethz.pages.start
2394
ethz.pages.end
2401
ethz.event
IEEE Computer Society Conference on Computer Vision and Pattern Recognition 2006 (CVPR 2006)
ethz.event.location
New York, NY, USA
ethz.event.date
June 17-22, 2006
ethz.notes
Date of Current Version 9 October 2006.
ethz.publication.place
Piscataway, NJ
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02652 - Institut für Bildverarbeitung / Computer Vision Laboratory::03514 - Van Gool, Luc / Van Gool, Luc
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02652 - Institut für Bildverarbeitung / Computer Vision Laboratory::03514 - Van Gool, Luc / Van Gool, Luc
ethz.date.deposited
2017-06-14T19:28:14Z
ethz.source
ECIT
ethz.identifier.importid
imp59364e79961ea41379
ethz.ecitpid
pub:65425
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-20T14:28:36Z
ethz.rosetta.lastUpdated
2020-02-15T05:21:26Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
ethz.COinS
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