Investigation of thermal transport degradation in rough Si nanowires - Research Collection

Metadata only

Author

Luisier, Mathieu

Date

2011

Type

Journal Article

Citations

Cited 22 times in Web of Science

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1063/1.3644993

Journal / series

Journal of Applied Physics

Volume

110

Pages / Article No.

074510

Publisher

American Institute of Physics

Organisational unit

03925 - Luisier, Mathieu / Luisier, Mathieu

Notes

Received 06 May 2011, Accepted 20 August 2011, Published online 05 October 2011.

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Citations

Cited 22 times in Web of Science

ETH Bibliography

yes

Altmetrics