Correlation between the defect structure and the residual stress distribution in ZnO visualized by TEM and Raman microscopy

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Author
Wermelinger, Thomas
Mornaghini, Flavio C.F.
Hinderling, Christian
Spolenak, Ralph
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Date
2010-01-15
Type
    Journal Article
Publication status
published
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Journal / series
Materials Letters
Volume
64(1)
Pages / Article No.
28 - 30
Publisher
North-Holland
Subject
Raman microscopy; TEM; Residual stresses; Microstructure; ZnO; Cathodoluminescence
Organisational unit
03692 - Spolenak, Ralph / Spolenak, Ralph  
Notes
Received 14 September 2009, Accepted 30 September 2009, Available online 5 October 2009.
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