Correlation between the defect structure and the residual stress distribution in ZnO visualized by TEM and Raman microscopy - Research Collection

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Author

Wermelinger, Thomas

Mornaghini, Flavio C.F.

Hinderling, Christian

Spolenak, Ralph

Date

2010-01-15

Type

Journal Article

Citations

Cited 7 times in Web of Science

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1016/j.matlet.2009.09.061

Journal / series

Materials letters

Volume

64(1)

Pages / Article No.

28 - 30

Publisher

North-Holland

Subject

Raman microscopy; TEM; Residual stresses; Microstructure; ZnO; Cathodoluminescence

Organisational unit

03692 - Spolenak, Ralph

Notes

Received 14 September 2009, Accepted 30 September 2009, Available online 5 October 2009.

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Citations

Cited 7 times in Web of Science

ETH Bibliography

yes

Altmetrics