Correlation between the defect structure and the residual stress distribution in ZnO visualized by TEM and Raman microscopy
Mornaghini, Flavio C.F.
- Journal Article
Journal / seriesMaterials letters
SubjectRaman microscopy; TEM; Residual stresses; Microstructure; ZnO; Cathodoluminescence
Organisational unit03692 - Spolenak, Ralph
NotesReceived 14 September 2009, Accepted 30 September 2009, Available online 5 October 2009.
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