Correlation between the defect structure and the residual stress distribution in ZnO visualized by TEM and Raman microscopy
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Date
2010-01-15Type
- Journal Article
ETH Bibliography
yes
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Publication status
publishedExternal links
Journal / series
Materials LettersVolume
Pages / Article No.
Publisher
North-HollandSubject
Raman microscopy; TEM; Residual stresses; Microstructure; ZnO; CathodoluminescenceOrganisational unit
03692 - Spolenak, Ralph / Spolenak, Ralph
Notes
Received 14 September 2009, Accepted 30 September 2009, Available online 5 October 2009.More
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ETH Bibliography
yes
Altmetrics