Correlation between the defect structure and the residual stress distribution in ZnO visualized by TEM and Raman microscopy

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Author

Date

2010-01-15

Type

Journal Article

ETH Bibliography

yes

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Publication status

published

External links

Journal / series

Materials Letters

Volume

64(1)

Pages / Article No.

28 - 30

Publisher

North-Holland

Subject

Raman microscopy; TEM; Residual stresses; Microstructure; ZnO; Cathodoluminescence

Organisational unit

03692 - Spolenak, Ralph / Spolenak, Ralph

Notes

Received 14 September 2009, Accepted 30 September 2009, Available online 5 October 2009.

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