Integrated Cantilevers and Atomic Force Microscopes
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Date
2007Type
- Book Chapter
ETH Bibliography
yes
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Publication status
publishedEditor
Book title
Applied scanning probe methods. 5, Scanning probe microscopy techniquesJournal / series
Nanoscience and technologyPages / Article No.
Publisher
SpringerOrganisational unit
03684 - Hierlemann, Andreas / Hierlemann, Andreas
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ETH Bibliography
yes
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