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dc.contributor.author
Hafizovic, Sadik
dc.contributor.author
Kirstein, Kay-Uwe
dc.contributor.author
Hierlemann, Andreas
dc.contributor.editor
Bhushan, Bharat
dc.contributor.editor
Kawata, Satoshi
dc.contributor.editor
Fuchs, Harald
dc.date.accessioned
2017-06-19T13:04:43Z
dc.date.available
2017-06-19T13:04:43Z
dc.date.issued
2007
dc.identifier.isbn
3-540-37315-2
dc.identifier.isbn
978-3-540-37315-5
dc.identifier.isbn
978-3-540-37316-2
dc.identifier.issn
1434-4904
dc.identifier.other
10.1007/978-3-540-37316-2_1
dc.identifier.uri
http://hdl.handle.net/20.500.11850/161593
dc.language.iso
en
dc.publisher
Springer
dc.title
Integrated Cantilevers and Atomic Force Microscopes
dc.type
Book Chapter
ethz.book.title
Applied scanning probe methods. 5, Scanning probe microscopy techniques
ethz.journal.title
Nanoscience and technology
ethz.pages.start
1
ethz.pages.end
22
ethz.identifier.nebis
004542000
ethz.publication.place
Berlin
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02060 - Dep. Biosysteme / Dep. of Biosystems Science and Eng.::03684 - Hierlemann, Andreas / Hierlemann, Andreas
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02060 - Dep. Biosysteme / Dep. of Biosystems Science and Eng.::03684 - Hierlemann, Andreas / Hierlemann, Andreas
ethz.date.deposited
2017-06-19T13:05:40Z
ethz.source
ECIT
ethz.identifier.importid
imp59364b67d5ced10558
ethz.ecitpid
pub:13541
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-08-03T11:11:39Z
ethz.rosetta.lastUpdated
2018-11-05T11:41:23Z
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=Integrated%20Cantilevers%20and%20Atomic%20Force%20Microscopes&rft.jtitle=Nanoscience%20and%20technology&rft.date=2007&rft.spage=1&rft.epage=22&rft.issn=1434-4904&rft.au=Hafizovic,%20Sadik&Kirstein,%20Kay-Uwe&Hierlemann,%20Andreas&rft.isbn=3-540-37315-2&978-3-540-37315-5&978-3-540-37316-2&rft.genre=bookitem&rft_id=info:doi/10.1007/978-3-540-37316-2_1&rft.btitle=Applied%20scanning%20probe%20methods.%205,%20Scanning%20probe%20microscopy%20techniques
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