Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications
Metadata only
Date
2009-05-25Type
- Conference Paper
Publication status
publishedExternal links
Editor
Book title
14th IEEE European Test Symposium 2009Journal / series
IEEE European Test WorkshopsPages / Article No.
Publisher
IEEEEvent
Subject
Gate Stress Test; Gate Oxide Reliability; Burn-In; Low Side SwitchNotes
Publication Date 25-29 May 2009, Current Version Published 24 July 2009.More
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