Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications

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Author
Malandruccolo, V.
Ciappa, M.
Fichtner, W.
Rothleitner, H.
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Date
2009-05-25
Type
  • Conference Paper
Publication status
published
External links
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Editor
Ceballos, Silvia
Book title
14th IEEE European Test Symposium 2009
Journal / series
IEEE European Test Workshops
Pages / Article No.
67 - 72
Publisher
IEEE
Event
14th IEEE European Test Symposium (ETS 2009), Sevilla, Spain, May 25-29, 2009
Subject
Gate Stress Test; Gate Oxide Reliability; Burn-In; Low Side Switch
Notes
Publication Date 25-29 May 2009, Current Version Published 24 July 2009.
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Citations
Cited 1 times in Web of Science
Cited 1 times in Scopus
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yes
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