Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications - Research Collection

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Author

Malandruccolo, V.

Ciappa, M.

Fichtner, W.

Rothleitner, H.

Date

2009-05-25

Type

Conference Paper

Citations

Cited 1 times in Web of Science

ETH Bibliography

yes

Altmetrics

Publication status

published

External links

https://doi.org/10.1109/ETS.2009.18

Editor

Ceballos, Silvia

Book title

14th IEEE European Test Symposium 2009

Journal / series

IEEE European Test Workshops

Pages / Article No.

67 - 72

Publisher

IEEE

Event

14th IEEE European Test Symposium (ETS 2009), Sevilla, Spain, May 25-29, 2009

Subject

Gate Stress Test; Gate Oxide Reliability; Burn-In; Low Side Switch

Notes

Publication Date 25-29 May 2009, Current Version Published 24 July 2009.

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Citations

Cited 1 times in Web of Science

ETH Bibliography

yes

Altmetrics