Empirical Ballistic Mobility Model for Drift-Diffusion Simulation
dc.contributor.author
Erlebach, Axel
dc.contributor.author
Lee, Helen
dc.contributor.author
Bufler, Fabian M.
dc.date.accessioned
2017-06-19T16:14:00Z
dc.date.available
2017-06-19T16:14:00Z
dc.date.issued
2016
dc.identifier.isbn
978-1-5090-2969-3
dc.identifier.isbn
978-1-5090-2970-9
dc.identifier.other
10.1109/ESSDERC.2016.7599675
dc.identifier.uri
http://hdl.handle.net/20.500.11850/164615
dc.language.iso
en
dc.publisher
IEEE
dc.title
Empirical Ballistic Mobility Model for Drift-Diffusion Simulation
dc.type
Conference Paper
ethz.book.title
46th European Solid-State Device Research Conference (ESSDERC)
ethz.journal.volume
46
ethz.pages.start
420
ethz.pages.end
423
ethz.event
46th European Solid-State Device Research Conference (ESSDERC 2016)
ethz.event.location
Lausanne, Switzerland
ethz.event.date
September 12-15, 2016
ethz.publication.place
Piscataway, NJ
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03925 - Luisier, Mathieu / Luisier, Mathieu
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03925 - Luisier, Mathieu / Luisier, Mathieu
ethz.date.deposited
2017-06-19T16:15:37Z
ethz.source
ECIT
ethz.identifier.importid
imp593655093d66885754
ethz.ecitpid
pub:187614
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-31T17:28:35Z
ethz.rosetta.lastUpdated
2018-11-05T12:39:16Z
ethz.rosetta.versionExported
true
ethz.COinS
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Conference Paper [33039]