Electronic band structure of the buried SiO2/SiC interface investigated by soft x-ray ARPES

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Author
Woerle, Judithcc
Bisti, Federico
Huşanu, Marius A.
Strocov, Vladimir N.
Schneider, Christof W.
Sigg, Hans
Gobrecht, Jens
Grossner, Ulrikecc
Camarda, Massimo
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Date
2017-03-27
Type
    Journal Article
Rights / license
In Copyright - Non-Commercial Use Permitted
Permanent link
https://doi.org/10.3929/ethz-b-000179926
Publication status
published
External links
Journal / series
Applied Physics Letters
Volume
110(13)
Pages / Article No.
132101
Publisher
American Institute of Physics
Organisational unit
09480 - Grossner, Ulrike / Grossner, Ulrike  
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Citations
Cited 7 times in Scopus
ETH Bibliography
yes
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