A Cost-Effective Atomic Force Microscope for Undergraduate Control Laboratories
Metadata only
Author
Jones, Colin N.
Goncalves, Jorge
Date
2010Type
- Journal Article
Publication status
publishedJournal / series
IEEE Transactions on EducationVolume
Pages
Publisher
IEEESubject
Atomic force microscope (AFM); control; microscopy; system identification; teaching laboratoryOrganisational unit
03416 - Morari, Manfred (emeritus)
Notes
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