A Cost-Effective Atomic Force Microscope for Undergraduate Control Laboratories

Thumbnail
Metadata only
Author
Jones, Colin N.
Goncalves, Jorge
Date
2010
Type
  • Journal Article
Publication status
published
External links
Full text via SFX
Journal / series
IEEE transactions on education
Volume
53(2)
Pages
328 - 334
Publisher
IEEE
Subject
Atomic force microscope (AFM); control; microscopy; system identification; teaching laboratory
Organisational unit
03416 - Morari, Manfred (emeritus)
Notes
.
More
Show all metadata
Altmetrics