A Cost-Effective Atomic Force Microscope for Undergraduate Control Laboratories - Research Collection

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Author

Jones, Colin N.

Goncalves, Jorge

Date

2010

Type

Journal Article

Citations

Cited 4 times in Web of Science

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1109/TE.2009.2021390

Journal / series

IEEE Transactions on Education

Volume

53(2)

Pages / Article No.

328 - 334

Publisher

IEEE

Subject

Atomic force microscope (AFM); control; microscopy; system identification; teaching laboratory

Organisational unit

03416 - Morari, Manfred (emeritus)

Notes

.

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Citations

Cited 4 times in Web of Science

ETH Bibliography

yes

Altmetrics