A Cost-Effective Atomic Force Microscope for Undergraduate Control Laboratories

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Author
Jones, Colin N.
Goncalves, Jorge
Date
2010
Type
  • Journal Article
Publication status
published
External links
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Journal / series
IEEE Transactions on Education
Volume
53(2)
Pages
328 - 334
Publisher
IEEE
Subject
Atomic force microscope (AFM); control; microscopy; system identification; teaching laboratory
Organisational unit
03416 - Morari, Manfred (emeritus)
Notes
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Citations
Cited 4 times in Web of Science
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