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dc.contributor.author
Spolenak, Ralph
dc.contributor.author
Ludwig, Wolfgang
dc.contributor.author
Buffiére, Jean Y.
dc.contributor.author
Michler, Johann
dc.date.accessioned
2021-09-09T13:33:38Z
dc.date.available
2017-06-08T22:54:59Z
dc.date.available
2021-09-09T13:33:38Z
dc.date.issued
2010-05
dc.identifier.issn
0883-7694
dc.identifier.issn
1938-1425
dc.identifier.other
10.1557/mrs2010.569
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/18231
dc.description.abstract
Understanding the mechanical properties of materials is crucial for their reliable application as bulk materials as well as in a miniaturized form. The deformation of materials is usually non-uniform and, hence, needs to be characterized on a local level. The following article focuses on the in-Situ determination of mechanical stresses in crystalline materials during deformation. This can be achieved by both diffraction as well as spectroscopical methods, where the elastic strain is the parameter measured, which is subsequently converted into stresses by the application of Hooke’s law. As in Situ measurements require rapid data acquisition in conjunction with reasonable penetration depths, we will focus on x-rays. However, the different techniques described can be applied to any other diffraction probe as well. The description of diffraction techniques, which span the range from averaging techniques to 2D and 3D strain mapping, is complemented by a section on Raman spectroscopy as an alternative method for stress determination for non-metallic materials. Local stresses also can be correlated to local defect densities.
en_US
dc.language.iso
en
en_US
dc.publisher
Material Research Society
en_US
dc.title
In Situ Elastic Strain Measurements—Diffraction and Spectroscopy
en_US
dc.type
Journal Article
dc.date.published
2011-01-31
ethz.journal.title
MRS Bulletin
ethz.journal.volume
35
en_US
ethz.journal.issue
5
en_US
ethz.journal.abbreviated
MRS bull.
ethz.pages.start
368
en_US
ethz.pages.end
374
en_US
ethz.identifier.wos
ethz.publication.place
Pittsburgh, PA
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::02645 - Institut für Metallforschung / Institute of Metals Research::03692 - Spolenak, Ralph / Spolenak, Ralph
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::02645 - Institut für Metallforschung / Institute of Metals Research::03692 - Spolenak, Ralph / Spolenak, Ralph
ethz.date.deposited
2017-06-08T22:55:16Z
ethz.source
ECIT
ethz.identifier.importid
imp59364c8b4749b20440
ethz.ecitpid
pub:30347
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2017-07-12T17:50:20Z
ethz.rosetta.lastUpdated
2022-03-29T11:52:08Z
ethz.rosetta.versionExported
true
ethz.COinS
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