New Calorimetric Power Transistor Soft-Switching Loss Measurement Based on Accurate Temperature Rise Monitoring

Open access
Date
2017Type
- Conference Paper
Permanent link
https://doi.org/10.3929/ethz-b-000187520Publication status
publishedExternal links
Book title
Proceedings of the 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD)Pages / Article No.
Publisher
IEEEEvent
Subject
WBG power semiconductor; Soft-switching losses; ZVS losses; Calorimetric measuermentOrganisational unit
03573 - Kolar, Johann W. (emeritus) / Kolar, Johann W. (emeritus)
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