New Calorimetric Power Transistor Soft-Switching Loss Measurement Based on Accurate Temperature Rise Monitoring

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Author
Neumayr, Dominik
Guacci, Mattia
Bortis, Dominikcc
Kolar, Johann W.cc
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Date
2017
Type
    Conference Paper
Rights / license
In Copyright - Non-Commercial Use Permitted
Permanent link
https://doi.org/10.3929/ethz-b-000187520
Publication status
published
External links
Book title
Proceedings of the 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD)
Pages / Article No.
447 - 450
Publisher
IEEE
Event
The 29th International Symposium on Power Semiconductor Devices and ICs (ISPSD 2017), Sapporo, Japan, May 28 - June 1, 2017
Subject
WBG power semiconductor; Soft-switching losses; ZVS losses; Calorimetric measuerment
Organisational unit
03573 - Kolar, Johann W. (emeritus) / Kolar, Johann W. (emeritus)  
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Citations
Cited 48 times in Scopus
ETH Bibliography
yes
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