Low-Jitter GaN E-HEMT Gate Driver with High Common-Mode Voltage Transient Immunity
Open access
Author
Date
2017-11Type
- Journal Article
Permanent link
https://doi.org/10.3929/ethz-b-000189431Publication status
publishedExternal links
Journal / series
IEEE Transactions on Industrial ElectronicsVolume
Pages / Article No.
Publisher
IEEESubject
Low-jitter gate driver; Common-mode tran- sient immunity (CMTI); Low noise switch-mode power amplifier; Wide-bandgap gallium nitride power semiconductors; Signal to Noise Ratio (SNR)Organisational unit
03573 - Kolar, Johann W. / Kolar, Johann W.
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