Error Characterization, Mitigation, and Recovery in Flash-Memory-Based Solid-State Drives

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Author
Cai, Yu
Ghose, Saugata
Haratsch, Erich F.
Luo, Yixin
Mutlu, Onur
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Date
2017-09
Type
    Journal Article
Publication status
published
External links
Journal / series
Proceedings of the IEEE
Volume
105(9)
Pages / Article No.
1666 - 1704
Publisher
IEEE
Subject
Data storage systems; error recovery; fault tolerance; flash memory; reliability; solid-state drives
Organisational unit
09483 - Mutlu, Onur / Mutlu, Onur  
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Citations
Cited 128 times in Web of Science
Cited 164 times in Scopus
ETH Bibliography
yes
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