Error Characterization, Mitigation, and Recovery in Flash-Memory-Based Solid-State Drives - Research Collection

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Author

Cai, Yu

Ghose, Saugata

Haratsch, Erich F.

Luo, Yixin

Mutlu, Onur

Date

2017-09

Type

Journal Article

Citations

Cited 4 times in Web of Science

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1109/JPROC.2017.2713127

Journal / series

Proceedings of the IEEE

Volume

105(9)

Pages / Article No.

1666 - 1704

Publisher

IEEE

Subject

Data storage systems; error recovery; fault tolerance; flash memory; reliability; solid-state drives

Organisational unit

09483 - Mutlu, Onur

More

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Citations

Cited 4 times in Web of Science

ETH Bibliography

yes

Altmetrics