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Non-destructive measurement of soybean leaf thickness via X-ray computed tomography allows the study of diel leaf growth rhythms in the third dimension
- Journal Article
Journal / seriesJournal of Plant Research
SubjectCircadian rhythm; Diel leaf growth pattern; Growth monitoring; Imaging; Leaf volume; Plant phenotyping
144078 - Lab to field plant phenotyping to improve crop performance in abiotic stress (SNF)
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