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dc.contributor.author
Koch, Tobias
dc.contributor.author
Lapidoth, Amos
dc.date.accessioned
2017-06-08T23:30:33Z
dc.date.available
2017-06-08T23:30:33Z
dc.date.issued
2010
dc.identifier.issn
0018-9448
dc.identifier.issn
1557-9654
dc.identifier.other
10.1109/TIT.2009.2039036
dc.identifier.uri
http://hdl.handle.net/20.500.11850/19316
dc.language.iso
en
dc.publisher
IEEE
dc.subject
Channel capacity
dc.subject
channels with memory
dc.subject
fading channels
dc.subject
flat fading
dc.subject
high signal-to-noise ratio (SNR)
dc.subject
multiplexing gain
dc.subject
noncoherent
dc.subject
time-selective
dc.title
Gaussian Fading Is the Worst Fading
dc.type
Journal Article
ethz.journal.title
IEEE Transactions on Information Theory
ethz.journal.volume
56
ethz.journal.issue
3
ethz.journal.abbreviated
IEEE trans. inf. theory
ethz.pages.start
1158
ethz.pages.end
1165
ethz.notes
Manuscript received 19 February 2009, Revised 30 October 2009, Current version published 10 March 2010.
ethz.identifier.nebis
000034939
ethz.publication.place
New York
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02639 - Inst. f. Signal- und Informationsverarb. / Signal and Information Processing Lab.::03529 - Lapidoth, Amos / Lapidoth, Amos
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02639 - Inst. f. Signal- und Informationsverarb. / Signal and Information Processing Lab.::03529 - Lapidoth, Amos / Lapidoth, Amos
ethz.date.deposited
2017-06-08T23:30:44Z
ethz.source
ECIT
ethz.identifier.importid
imp59364ca24783d66868
ethz.ecitpid
pub:31630
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T20:38:33Z
ethz.rosetta.lastUpdated
2018-10-01T08:21:59Z
ethz.rosetta.versionExported
true
ethz.COinS
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