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dc.contributor.author
Waffler, Stefan
dc.contributor.author
Kolar, Johann W.
dc.date.accessioned
2018-04-10T11:23:25Z
dc.date.available
2017-10-25T09:39:27Z
dc.date.available
2018-04-10T11:23:25Z
dc.date.issued
2008-10
dc.identifier.uri
http://hdl.handle.net/20.500.11850/200326
dc.language.iso
en
en_US
dc.title
High Temperature Gate Drive for SiC-JFETs
en_US
dc.type
Other Conference Item
ethz.event
ECPE - HOPE Symposium on Automotive Power Electronics
en_US
ethz.event.location
Sindelfingen, Germany
en_US
ethz.event.date
October 7-8, 2008
en_US
ethz.notes
Conference lecture on October 8, 2008
en_US
ethz.publication.status
unpublished
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::03573 - Kolar, Johann W. / Kolar, Johann W.
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::03573 - Kolar, Johann W. / Kolar, Johann W.
en_US
ethz.date.deposited
2017-10-25T09:39:28Z
ethz.source
FORM
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2018-04-10T11:23:28Z
ethz.rosetta.lastUpdated
2018-11-06T17:42:14Z
ethz.rosetta.versionExported
true
ethz.COinS
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