Electron beam confinement and image contrast enhancement in near field emission scanning electron microscopy
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Date
2009Type
- Journal Article
ETH Bibliography
yes
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Publication status
publishedExternal links
Journal / series
UltramicroscopyVolume
Pages / Article No.
Publisher
ElsevierSubject
Field emission; SEM; STMNotes
Available online 27 November 2008.More
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ETH Bibliography
yes
Altmetrics