Electron beam confinement and image contrast enhancement in near field emission scanning electron microscopy - Research Collection

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Author

Kirk, T. L.

De Pietro, L.G.

Pescia, D.

Ramsperger, U.

Date

2009

Type

Journal Article

Citations

Cited 6 times in Web of Science

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1016/j.ultramic.2008.11.009

Journal / series

Ultramicroscopy

Volume

109(5)

Pages / Article No.

463 - 466

Publisher

Elsevier

Subject

Field emission; SEM; STM

Notes

Available online 27 November 2008.

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Citations

Cited 6 times in Web of Science

ETH Bibliography

yes

Altmetrics