Electron beam confinement and image contrast enhancement in near field emission scanning electron microscopy

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Author
Kirk, T. L.
De Pietro, L.G.
Pescia, D.
Ramsperger, U.
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Date
2009
Type
  • Journal Article
Publication status
published
External links
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Journal / series
Ultramicroscopy
Volume
109(5)
Pages
463 - 466
Publisher
Elsevier
Subject
Field emission; SEM; STM
Notes
Available online 27 November 2008.
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