Electron beam confinement and image contrast enhancement in near field emission scanning electron microscopy

Thumbnail
Metadata only
Author
Kirk, T. L.
De Pietro, L.G.
Pescia, Danilocc
Ramsperger, U.
Show all
Date
2009
Type
    Journal Article
Publication status
published
External links
Journal / series
Ultramicroscopy
Volume
109(5)
Pages / Article No.
463 - 466
Publisher
Elsevier
Subject
Field emission; SEM; STM
Notes
Available online 27 November 2008.
More
Show all metadata
ETH Bibliography
yes
Altmetrics