Lateral interdot coupling among dense ensemble of InAs quantum dots grown on InP substrate observed at cryogenic temperatures

Abstract

The lateral interdot coupling is investigated in high density (~10 cm−2 ) self-assembled InAs quantum dots (QDs) grown on an InP substrate. Two types of structures are selected for this study, in which QDs are embedded into an InAlAs matrix, forming nearly twice stronger confinement for an electron and a hole than expected for an InAlGaAs counterpart. Resonantly injected low carrier population in these families of QDs gives very different spectral and temporal response in the temperature range of 5-30 K. While InAs/InAlGaAs QDs show monotonic temperature quench of photoluminescence (PL), the process seems to be ineffective in the family of InAs/InAlAs dots. Moreover, the PL decay traces for InAs/InAlGaAs QDs reveal a two-exponential decay as compared to a mono-exponential one observed for InAs/InAlAs dots. While a short decay component of ≤1.9 ns has been attributed to recombination of an electron-hole pair confined in the dot, the long one of >2.4 ns, observed exclusively for InAs/InGaAlAs QDs, is attributed to recombination of spatially separated electron-hole pairs formed due to carrier exchange between adjacent dots.