A scan-chain based state retention methodology for IoT processors operating on intermittent energy

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Author
Hager, Pascal A.
Fatemi, Hamed
de Gyvez, José P.
Benini, Lucacc
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Date
2017
Type
    Conference Paper
Rights / license
In Copyright - Non-Commercial Use Permitted
Permanent link
https://doi.org/10.3929/ethz-b-000219283
Publication status
published
Book title
Proceedings of the 2017 Design, Automation & Test in Europe (DATE 2017)
Pages / Article No.
1171 - 1176
Publisher
IEEE
Event
20th Conference and Exhibition on Design, Automation and Test in Europe (DATE 2017), Lausanne, Switzerland, March 27-31, 2017
Organisational unit
03996 - Benini, Luca / Benini, Luca  
Funding
157048 - Transient Computing Systems (SNF)
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Citations
Cited 8 times in Scopus
ETH Bibliography
yes
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