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dc.contributor.author
Hager, Pascal A.
dc.contributor.author
Fatemi, Hamed
dc.contributor.author
de Gyvez, José P.
dc.contributor.author
Benini, Luca
dc.date.accessioned
2017-12-08T11:22:54Z
dc.date.available
2017-12-08T09:40:00Z
dc.date.available
2017-12-08T09:56:58Z
dc.date.available
2017-12-08T10:00:23Z
dc.date.available
2017-10-06T04:28:47Z
dc.date.available
2017-10-10T09:23:11Z
dc.date.available
2017-12-08T10:20:40Z
dc.date.available
2017-12-08T11:22:54Z
dc.date.issued
2017
dc.identifier.isbn
978-3-9815370-8-6
en_US
dc.identifier.isbn
978-3-9815370-9-3
en_US
dc.identifier.isbn
978-1-5090-5826-6
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/219283
dc.identifier.doi
10.3929/ethz-b-000219283
dc.format
application/pdf
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.rights.uri
http://rightsstatements.org/page/InC-NC/1.0/
dc.title
A scan-chain based state retention methodology for IoT processors operating on intermittent energy
en_US
dc.type
Conference Paper
dc.rights.license
In Copyright - Non-Commercial Use Permitted
dc.date.published
2017-05-15
ethz.book.title
Proceedings of the 2017 Design, Automation & Test in Europe (DATE 2017)
en_US
ethz.pages.start
1171
en_US
ethz.pages.end
1176
en_US
ethz.version.deposit
acceptedVersion
en_US
ethz.event
20th Conference and Exhibition on Design, Automation and Test in Europe (DATE 2017)
en_US
ethz.event.location
Lausanne, Switzerland
en_US
ethz.event.date
March 27-31, 2017
en_US
ethz.grant
Transient Computing Systems
en_US
ethz.identifier.wos
ethz.identifier.scopus
ethz.publication.place
Piscataway, NJ
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03996 - Benini, Luca / Benini, Luca
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03996 - Benini, Luca / Benini, Luca
ethz.grant.agreementno
157048
ethz.grant.fundername
SNF
ethz.grant.funderDoi
10.13039/501100001711
ethz.grant.program
Projekte MINT
ethz.date.deposited
2017-10-06T04:29:00Z
ethz.source
FORM
ethz.source
SCOPUS
ethz.eth
yes
en_US
ethz.availability
Open access
en_US
ethz.rosetta.installDate
2017-12-08T11:22:57Z
ethz.rosetta.lastUpdated
2022-03-28T18:36:20Z
ethz.rosetta.versionExported
true
dc.identifier.olduri
http://hdl.handle.net/20.500.11850/192077
dc.identifier.olduri
http://hdl.handle.net/20.500.11850/219225
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=A%20scan-chain%20based%20state%20retention%20methodology%20for%20IoT%20processors%20operating%20on%20intermittent%20energy&rft.date=2017&rft.spage=1171&rft.epage=1176&rft.au=Hager,%20Pascal%20A.&Fatemi,%20Hamed&de%20Gyvez,%20Jos%C3%A9%20P.&Benini,%20Luca&rft.isbn=978-3-9815370-8-6&978-3-9815370-9-3&978-1-5090-5826-6&rft.genre=proceeding&rft.btitle=Proceedings%20of%20the%202017%20Design,%20Automation%20&%20Test%20in%20Europe%20(DATE%202017)
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