Noise-Induced Breakdown of Stochastic Resonant Behavior of van der Pol Oscillators Coupled by Time-Varying Resistor

Metadata only

Author

Date

2009

Type

Conference Paper

ETH Bibliography

yes

Altmetrics

Publication status

published

External links

Book title

IEEE International Symposium on Circuits and Systems, 2009 : ISCAS 2009 ; Taipei, Taiwan, 24 - 27 May 2009

Pages / Article No.

1887 - 1890

Publisher

IEEE

Event

IEEE International Symposium on Circuits and Systems 2009 (ISCAS 2009), Taipei, Taiwan, May 24-27, 2009

More

ETH Bibliography

yes

Altmetrics

Research Collection